Yes, one can obtain better quality structures from routine X-ray data collection

Research output: Contribution to journalJournal articleResearchpeer-review

Documents

W. Fabiola Sanjuan-Szklarz, Anna A. Hoser, Matthias Gutmann, Anders Østergaard Madsen, Krzysztof Wozniak

Original languageEnglish
JournalIUCrJ
Volume3
Pages (from-to)61-70
Number of pages10
ISSN2052-2525
DOIs
Publication statusPublished - 2016

    Research areas

  • X-ray diffraction results, precision, independent atom model, transferable aspherical atom model, geometric parameters, TLS analysis

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ID: 164212057