Standard
Yes, one can obtain better quality structures from routine X-ray data collection. / Sanjuan-Szklarz, W. Fabiola; Hoser, Anna A.; Gutmann, Matthias; Madsen, Anders Østergaard; Wozniak, Krzysztof.
In:
IUCrJ, Vol. 3, 2016, p. 61-70.
Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Sanjuan-Szklarz, WF, Hoser, AA, Gutmann, M
, Madsen, AØ & Wozniak, K 2016, '
Yes, one can obtain better quality structures from routine X-ray data collection',
IUCrJ, vol. 3, pp. 61-70.
https://doi.org/10.1107/S2052252515020941APA
Sanjuan-Szklarz, W. F., Hoser, A. A., Gutmann, M.
, Madsen, A. Ø., & Wozniak, K. (2016).
Yes, one can obtain better quality structures from routine X-ray data collection.
IUCrJ,
3, 61-70.
https://doi.org/10.1107/S2052252515020941Vancouver
Sanjuan-Szklarz WF, Hoser AA, Gutmann M
, Madsen AØ, Wozniak K.
Yes, one can obtain better quality structures from routine X-ray data collection.
IUCrJ. 2016;3:61-70.
https://doi.org/10.1107/S2052252515020941Author
Sanjuan-Szklarz, W. Fabiola ; Hoser, Anna A. ; Gutmann, Matthias ; Madsen, Anders Østergaard ; Wozniak, Krzysztof. / Yes, one can obtain better quality structures from routine X-ray data collection. In: IUCrJ. 2016 ; Vol. 3. pp. 61-70.
Bibtex
@article{a961a9465cb94824b2216441013a30f5,
title = "Yes, one can obtain better quality structures from routine X-ray data collection",
keywords = "X-ray diffraction results, precision, independent atom model, transferable aspherical atom model, geometric parameters, TLS analysis",
author = "Sanjuan-Szklarz, {W. Fabiola} and Hoser, {Anna A.} and Matthias Gutmann and Madsen, {Anders {\O}stergaard} and Krzysztof Wozniak",
year = "2016",
doi = "10.1107/S2052252515020941",
language = "English",
volume = "3",
pages = "61--70",
journal = "I U Cr J",
issn = "2052-2525",
publisher = "International Union of Crystallography",
}
RIS
TY - JOUR
T1 - Yes, one can obtain better quality structures from routine X-ray data collection
AU - Sanjuan-Szklarz, W. Fabiola
AU - Hoser, Anna A.
AU - Gutmann, Matthias
AU - Madsen, Anders Østergaard
AU - Wozniak, Krzysztof
PY - 2016
Y1 - 2016
KW - X-ray diffraction results
KW - precision
KW - independent atom model
KW - transferable aspherical atom model
KW - geometric parameters
KW - TLS analysis
U2 - 10.1107/S2052252515020941
DO - 10.1107/S2052252515020941
M3 - Journal article
C2 - 26870382
VL - 3
SP - 61
EP - 70
JO - I U Cr J
JF - I U Cr J
SN - 2052-2525
ER -
